International Training Program of Johan Arbustini

As part of the Collaborative Research Center 1261, I had the great opportunity to attend an international training program organized by MEAD Education at the Swiss Federal Institute of Technology Lausanne (EPFL). This program featured courses taught by world-renowned technical fellows and professors from leading high-technology companies and prestigious universities. The blend of academic and industrial instructors provided comprehensive coverage of both theoretical and practical aspects of data converters.

The course "Practical Design of Data Converters in CMOS Technologies" focused on state-of-the-art topics of current interest in research. It provided an in-depth overview of various data converters, including pipeline ADCs, Sigma-Delta modulators, current DACs, SAR ADCs, and hybrid ADCs. This training was a unique opportunity to delve into the latest advancements and research opportunities in the field.

Additionally, the program facilitated interactive discussions with participants from both industry and academia. The ability to engage directly with experts and peers, discussing technical challenges and innovative solutions in data converter design, was invaluable for my research.

I want to extend my sincere gratitude to the Collaborative Research Center 1261 and the German Research Foundation (DFG) for their financial support of this professional education course. I am confident that the knowledge and insights gained will be beneficial to the project scope of B1 in the current CRC phase.

Johan Arbustini


Further Details

Course details
MEAD Education certificate Practical Design of Data Converters
Instructors Prof. Dr. Marcel Pelgrom, Prof. Dr. Filip Tavernier, Prof. Dr. Shanthi Pavan, Prof. Dr. Kofi Makinwa, Prof. Dr. Klaas Bult, Prof. Dr. Ian Galton
Program period 17-21.06.2024
Visited university Swiss Federal Institute of Technology in Lausanne (EPFL), Switzerland


Some Pictures

The lecture was held at the Institute of Electrical and Micro Engineering building (School of Engineering (STI)). Prof. Dr. Marcel Pelgrom (left side; his IEEE Journal of Solid-State Circuits paper on mismatch is the third most cited paper in this top Journal) and Johan Arbustini (right side; doctoral researcher at B1).